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ISBN-10: 0470143797

ISBN-13: 9780470143797

ISBN-10: 0471699322

ISBN-13: 9780471699323

The Advances in Chemical Physics sequence offers the chemical physics and actual chemistry fields with a discussion board for serious, authoritative reviews of advances in each zone of the self-discipline. packed with state-of-the-art examine suggested in a cohesive demeanour now not chanced on somewhere else within the literature, each one quantity of the Advances in Chemical Physics sequence serves because the excellent complement to any complex graduate classification dedicated to the research of chemical physics.


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Additional resources for Advances in Chemical Physics: Aspects of the Study of Surfaces, Volume 27

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5 eV. Therefore in these instruments phonon-assisted inelastic scattering processes cannot be distinguished from the elastic events. The use of cylindrical monochromators and analyzers leads to improved resolution of AE-10 meV so that inelastic electron scattering by local modes of adsorbed specie^'^','^^ and optical surface phonons in semiconductor^'^^-'^^ can be observed directly. The great majority of LEED studies of surface atomic vibrat i o n ~ , ' ~ ~ , ' ~ ~however, ,'~~-'% are carried out by observing the temperature dependence of the "quasielastic" differential cross-sections defined by8*9 in which d2u/(dQdw) is the differential inelastic scattering cross-section associated with an energy loss of w = E- E'.

A common form taken for this Hamiltonian is6,19,248 H,= -h2A +X(E)O(t) 2m ih Z ( E ) = - Vo- -[2m(E+ m’ee V,)]1/ 2 The real part of the optical potential, - Yo, is caused primarily by the exchange interaction of the incident electron with the valence electrons in the solid. ” The imaginary part of the optical potential describes the removal of electrons from the elastic beam by inelastic electron-electron collisions. It is expressed in terms of the inelastic collision damping length A,, in (28).

Collision mean free path, Xee-2 to 10 Their main consequence is that surface crystallography via ELEED differs from bulk crystallography via X-ray diffraction only in the technical complexity of the analytical procedure. The essential input ingredients in both analyses are identical: a simple model of the electronic charge density around the atoms (obtained from standard references like the book by Herman and Skillman243)and a set of computer programs that convert these charge densities plus a hypothetical structure into model intensities for comparison with experimental data.

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Advances in Chemical Physics: Aspects of the Study of Surfaces, Volume 27 by PRIGOGINE, RICE

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